Search for "conductive atomic force microscopy (C-AFM)" in Full Text gives 5 result(s) in Beilstein Journal of Nanotechnology.
Beilstein J. Nanotechnol. 2022, 13, 1256–1267, doi:10.3762/bjnano.13.104
Beilstein J. Nanotechnol. 2020, 11, 453–465, doi:10.3762/bjnano.11.37
Beilstein J. Nanotechnol. 2018, 9, 1623–1628, doi:10.3762/bjnano.9.154
Beilstein J. Nanotechnol. 2018, 9, 129–136, doi:10.3762/bjnano.9.15
Beilstein J. Nanotechnol. 2017, 8, 579–589, doi:10.3762/bjnano.8.62